Measuring Shape in the Presence of Inter-reflections, Sub-surface Scattering and Defocus
Depth Map (Our Technique)
The goal of this work is to build an end-to-end system for structured light 3D scanning under a broad range of global illumination effects, such as inter-reflections, diffusion and sub-surface scattering. We have designed structured light patterns that are resilient to individual global illumination effects using simple logical operations and tools from combinatorial mathematics. Scenes exhibiting multiple phenomena are handled by combining results from a small ensemble of such patterns. Our methods can be readily incorporated into existing scanning systems without a significant overhead in terms of capture time or hardware.
Mohit Gupta, Amit Agrawal, Ashok Veeraraghavan, Srinivasa G. Narasimhan
IEEE Computer Vision and Pattern Recognition (CVPR) 2011
"Structured Light 3D Scanning in the Presence of Global Illumination"
The scene shown above has significant global illumination in the form of interreflections and sub-surface scattering. Conventional Gray codes and phase-shifting result in errors at points receiving inter-reflections. Modulated phase-shifting produces errors on translucent fruits. In contrast, the depth map computed using our techniques is nearly error free. Please see the compilation of results below for more examples.